发明名称 |
Space compression technique for pseudo-exhaustive self-testing of digital electronic circuits. |
摘要 |
<p>Compaction of the response signals produced by separate sets of sub-circuits within a digital circuit under test is accomplished by first analyzing each response signal produced by a corresponding set of sub-circuits (by way of a logic analyzer (16,18) to determine if the response signal has a particular pattern. A pattern bit is then set in accordance with the response signal which has the particular pattern. The pattern bits are then compacted by a set of daisy-chained time compactors (20), each compactor serving to exclusively OR the pattern bit from a corresponding logic analyzer (16,18) with a compacted bit generated previously by an upstream compactor. <IMAGE></p> |
申请公布号 |
EP0517444(A2) |
申请公布日期 |
1992.12.09 |
申请号 |
EP19920304900 |
申请日期 |
1992.05.29 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
MOSKOWITZ, MARSHA RAMER;WU, ELEANOR |
分类号 |
G01R31/28;G06F11/27;G06F11/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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