发明名称 Process for fabricating self-aligned metal gate field effect transistors
摘要 A method of fabricating a metal-gate field effect transistor having source and drain regions which are self-aligned with the gate. The source and drain dopants are introduced into the substrate and driven. Then, a metal gate is formed, the metal gate having a length which is approximately the same as the length of the channel. After the gate is fabricated, dopant ions are implanted into any portions of the channel not covered by the gate. These dopant ions are activated by rapid thermal annealing at a temperature selected to avoid damage to the metal gate, to form bridge regions which extend one or both of the source/drain regions into the channel and which are self-aligned with the gate.
申请公布号 US5169796(A) 申请公布日期 1992.12.08
申请号 US19910762612 申请日期 1991.09.19
申请人 TELEDYNE INDUSTRIES, INC. 发明人 MURRAY, ROGER;GODHWANI, NEVAND
分类号 H01L21/336;H01L21/8238 主分类号 H01L21/336
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