THICKNESS AND FLAW DETECTION USING TIME MAPPING INTO MEMORY TECHNIQUE

摘要

The invention pertains generally to ultrasonic imaging systems and is more particularly directed to use of such systems for nondestructive testing to measure the thickness of parts, or to examine parts suspected of having internal flaws but where access is often limited to the external surfaces. The invention makes thickness and flaw determinations of substantial accuracy without resulting to use of an expensive ultra high frequency clock to measure time.