| 摘要 |
<p>During the in-circuit testing of electronic components, stimulus pulses are applied to a circuit bus producing an improper output signal, and the response of the circuit at various nodes connected to the bus is sensed with a current proble. An output signal from the current probe that is indicative of the magnitude and relative direction of the sensed current is sampled during each of the stimulus pulses to thereby isolate the portion of the output signal relating to the pulses from any noise in the circuit being tested. The sampled signal is further integrated to provide an additional measure of isolation, so that the probe signal processing circuit is relatively insensitive to both constant, high frequency noise and random, irregular or low frequency noise components.</p> |
