发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TESTING METHOD
摘要 PURPOSE:To minimize the increase of a logic scale for testing an interrupt control function and to improve the efficiency of a test design. CONSTITUTION:To an interrupt control circuit 10 which receives plural interrupt signals, arbitrates competing requests corresponding to the state of these signals and is capable of outputting the result, a testing register 11 alternately outputting a signal corresponding to part of the interrupt signal, that is, an interrupt element in which it is difficult to generate the interrupt, for example, or the interrupt element which may be deleted or added, is provided, by writing desired information in the testing register, the test of the interrupt control function can be enabled without depending on the operation of a function block corresponding to the signal to be alternated with. Since the testing register is provided so as to be restricted to partial interrupt signal, the increase of the logic scale of the circuit to be used only for the test can be minimized.
申请公布号 JPH04343146(A) 申请公布日期 1992.11.30
申请号 JP19910143822 申请日期 1991.05.20
申请人 HITACHI LTD 发明人 MITSUISHI NAOMIKI
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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