发明名称 PROCESS AND APPARATUS FOR PHYSICAL-CHEMICAL ANALYSIS BASED ON THE CONTROL OF INTERFACE TENSIONS
摘要 PCT No. PCT/FR92/00227 Sec. 371 Date Apr. 22, 1994 Sec. 102(e) Date Apr. 22, 1994 PCT Filed Mar. 12, 1992 PCT Pub. No. WO92/16824 PCT Pub. Date Oct. 1, 1992.Process and apparatus for analyzing the characteristics of a liquid/fluid interface, especially in the presence of surface-active agents. A tensiometer operates according to the principle of the suspended drop and the amount of liquid injected in the drop is adjusted according to the value of the calculated interface tension; the volume of the formed drop is progressively increased as the interface tension tends to diminish. A drop-forming device (30) can acquire an image of the drop and read the drop contour (40), can calculate the interface tension based on the shape and the size of the contour, and can adjust the same. A method of high speed measurement of interface tension uses all the points in the drop contour and provides a value in less than a second with the aid of a microcomputer.
申请公布号 WO9216824(A3) 申请公布日期 1992.11.26
申请号 WO1992FR00227 申请日期 1992.03.12
申请人 UNIVERSITE DE TOULON ET DU VAR, LABORATOIRE S I T 发明人 RICHOU, JACQUES;GRIMALDI, MICHEL;VERGER, ROBERT;RIVIERE, CLAUDE;BOIS, ANDRE;NURY, SYLVIE
分类号 G01N13/02 主分类号 G01N13/02
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