发明名称 Method of manufacturing a thin film transistor
摘要 First, a gate metal layer, a gate insulating film, a semiconductor layer, an n-type semiconductor layer, and an ohmic metal layer formed on a substrate in the order mentioned. Then, the film and the layers are patterned into those having the same shape and size. Next, a source metal layer and a drain metal layer are formed on the ohmic metal layer. Further, a portion of the ohmic metal layer, a portion of said source metal layer, and a portion of said drain metal layer are etched, thereby forming a channel portion. Finally, a transparent electrode is formed on the source metal layer, thus manufacturing a TFT. Since the film and the layer, the major components of the TFT, are sequentially formed, and are patterned simultaneously, the TFT can be manufacture with high yield. Further, since the transparent electrode is formed on the uppermost layer, i.e., the source metal layer, the pixel has a great opening ratio.
申请公布号 US5166085(A) 申请公布日期 1992.11.24
申请号 US19900503269 申请日期 1990.04.02
申请人 CASIO COMPUTER CO., LTD. 发明人 WAKAI, HARUO;YAMAMURA, NOBUYUKI;SATO, SYUNICHI;KANBARA, MINORU
分类号 G02F1/1333;G02F1/1362;G02F1/1368;H01L27/12;H01L29/786 主分类号 G02F1/1333
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