| 摘要 |
An apparatus for detecting defects in discrete articles, such as fasteners having an indexable article carrier with a plurality of article holders on the article carrier for supporting articles in a holding position so that each article in the holding position moves in a prescribed path as the article carrier is operated; structure for incrementally indexing the article carrier to position each article holder alternatively in (a) a first position in which an article can be inserted therein from a supply, and (b) a second position spaced from said first position; structure for shifting an article in a holder in the second position out of the holding position therefor into an inspecting position and for rotating an article in a holder in an inspecting position so that the complete periphery of an article to be inspected is exposed for examination is included; and eddy current scanning structure for examining the exposed part of an article while being rotated in the inspection position therefor.
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