发明名称 MEASURING DEVICE FOR CHARGED PARTICLE POSITION AND VACUUM DUCT
摘要 PURPOSE:To get information of passing positions of charged particles over a long distance along a vacuum duct. CONSTITUTION:A plurality of strip lines 2 along the axial direction of a vacuum duct 1 are installed on the inner wall surface of a vacuum duct so that it is possible to get information of the positions of charged particles in the axial direction and the radial direction sccording to the hourly variations of the output signals of the above plurality of strip lines 2.
申请公布号 JPH04334900(A) 申请公布日期 1992.11.20
申请号 JP19910106169 申请日期 1991.05.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 CHIKUSHIMA CHIHIRO
分类号 G01T1/29;H05H7/00;H05H13/04 主分类号 G01T1/29
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