| 摘要 |
<p>PURPOSE:To provide a test handler device for testing with high accuracy a film carrier tape fed intermittently, CONSTITUTION:A title device is adapted to test a film carrier tape 1 such that pawls each insertable into holes 11 (e.g. sprocket holes) provided in the film carrier tape 1 are formed on an X-Y stage 9 movable in a direction Z of a type used upon wafer testing, and the film carrier tape is moved a predetermined distance (equal to the length of one chip) an with the X-Y stage 9 lifted each pawl 10 is inserted into the foregoing sprocket hole 11 for positioning thereof and simultaneously a probe 5 is brought into contact with a test pad 8 located on the tape.</p> |
