发明名称 |
CHARGED PARTICLE EXTRACTION ARRANGEMENT |
摘要 |
An arrangement is described for extracting charged particles which have been emitted from a sample due to the impact of a primary ion beam. The arrangement comprises an electrode arrangement effective to produce an electric potential which is non-linear along a chosen direction of travel of the particles. A system of einzel lenses is effective to match the trajectories of the particles passing from the electrode means to the analyser of a mass spectrometer.
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申请公布号 |
US5164594(A) |
申请公布日期 |
1992.11.17 |
申请号 |
US19910780806 |
申请日期 |
1991.10.22 |
申请人 |
KRATOS ANALYTICAL, LIMITED |
发明人 |
THOMPSON, STEPHEN P.;DOWSETT, MARK G. |
分类号 |
G21K1/087;G01Q70/10;H01J37/244;H01J37/252;H01J49/06 |
主分类号 |
G21K1/087 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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