发明名称 SEMICONDUCTOR DEVICE HAVING HIGH BREAKDOWN VOLTAGE AND LOW RESISTANCE AND METHOD OF FABRICATING THE SAME
摘要 A P+layer (3) and an N+layer (1) are provided on the top and bottom surfaces of an N-layer (21), respectively. An electrode (7) is formed on the P+layer (3), while an electrode (8) is formed on the bottom surface of the N+layer (1). In a direction from the electrode (7) to the electrode (8), the area of the cross section of the N-layer (21) is decreased, which cross section is perpendicular to the direction. An N--layer (22) is formed complementarily to the N-layer (21) which is decreased in cross-sectional area. When a potential applied to the electrode (8) is higher than a potential applied to the electrode (7), a depletion layer extends from a PN junction formed by the P+layer (3) and the N-layer (21). Since the impurity concentration of the N-layer ( 21) is lower than that of the P+layer (3), the depletion layer extends substantially to the N-layer (21). The depletion layer extending to the N-layer (21) substantially holds the voltage applied across the electrodes (7) and (8). In order to improve a breakdown voltage, the cross-sectional area of the N-layer (21) is preferably decreased exponentially. A field intensity in the depletion layer extending within the N-layer (21) hardly depends on a distance from the electrode (7) or (8).
申请公布号 US5164804(A) 申请公布日期 1992.11.17
申请号 US19910747016 申请日期 1991.08.19
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TERASHIMA, TOMOHIDE
分类号 H01L29/06;H01L29/08;H01L29/36;H01L29/47;H01L29/739;H01L29/78;H01L29/786;H01L29/861;H01L29/872 主分类号 H01L29/06
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