发明名称 FORMATION OF WIRING OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable wiring under a substrate (rear) while the diffusion of impurities from the contact hole side into a surface silicon layer of a stuck substrate is prevented. CONSTITUTION:In an SOI substrate formed by mutually sticking silicon substrates, a bit line 3 is formed under a silicon layer 1 for forming elements. When impurities are introduced into the bit line 3, a resist layer 20 is formed on a contact hole 5 and its periphery in which contact hole polycrystalline silicon layer 6 for electrically connecting the bit line 3 with the silicon layer 1 is buried. Thereby impurities are prevented from being introduced into at least the region in contact with the polycrystalline silicon layer 6 for connection use.
申请公布号 JPH04324660(A) 申请公布日期 1992.11.13
申请号 JP19910122456 申请日期 1991.04.24
申请人 SONY CORP 发明人 HASHIMOTO MAKOTO
分类号 H01L23/522;H01L21/768;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L23/522
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