| 摘要 |
PURPOSE:To determine the order selecting the objective fault in the formation of the test pattern of a logic circuit. CONSTITUTION:From the position of the fault of a logic circuit, the signal wire set to a fault signal with respect to each fault and the values of the observability of all of signal wires, a propagation distance calculation means 4 calculates the difference between the max. observability of the fault signal and that of a fault wire, that is, the propagation distance of the fault signal with respect to each fault. Next, a fault arranging means 5 arranges faults in the order of a larger propagation distance and this order is stored in a fault selecting order storage means 6. By selecting the objective fault in the formation of a test pattern in this order, the processing of the generation and propagation of the fault signal is reduced and the test pattern of the logic circuit can be formed with in a short time. |
