发明名称 THIN FILM TRANSISTOR
摘要 <p>PURPOSE:To improve characteristics of a transistor by approaching a threshold voltage of the transistor to a 0 volt so as to eliminate defects in the characteristics such as a deviation of the threshold voltage, slowing of a rise, a decrease in reliability due to formation of a defective level in a boundary between a semiconductor film and a gate insulating film in a self-alignment type active matrix board to be used for a liquid crystal driving element. CONSTITUTION:In a self-alignment type thin film transistor, a newly electrically insulated electrode 13 is provided in gate insulating films 12, 14 for isolating a semiconductor thin film 11 and a gate electrode 15.</p>
申请公布号 JPH04323874(A) 申请公布日期 1992.11.13
申请号 JP19910119451 申请日期 1991.04.23
申请人 A G TECHNOL KK 发明人 NAKAMURA NOBUHIRO
分类号 G02F1/136;G02F1/1368;H01L29/78;H01L29/786 主分类号 G02F1/136
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