发明名称 MANUFACTURE OF TRANSISTOR WITH VACUUM MICROELECTRONICS
摘要 <p>PURPOSE:To shorten distances among electrodes of a transistor by etching in the plural direction slantwise with respect to a main surface by the use of masks formed on a stepped electrode surface layer. CONSTITUTION:A tungsten layer 1 formed on a base made of silicon oxide is machined. Portions divided by slantwise etching serve as an emitter electrode 2, a pair of base electrodes 3 and a collector electrode 4. The surface portion 3a of the electrode 3 is lower than the surface portion 2a of the electrode 2 and higher than the surface portion 4a of the electrode 4, that is, there are steps in the electrodes 2, 3, 4. If a mask is formed on the surface of an electrode material layer having the steps and in a plane parallel to the main surface thereof, the mask has openings at remarkably small intervals at the steps. With application of slantwise etching in the plural directions by the use of the mask, distances among the electrodes 2, 3, 4 can become short owing to the steps. Consequently, heat can be radiated with high efficiency, thus achieving operation at a high speed.</p>
申请公布号 JPH04322031(A) 申请公布日期 1992.11.12
申请号 JP19910115431 申请日期 1991.04.19
申请人 SONY CORP 发明人 UGAJIN RYUICHI
分类号 H01J9/02;H01J19/24;H01J21/06;H01J21/10;H01L21/331;H01L29/73 主分类号 H01J9/02
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