MEASURING METHOD FOR REFRACTIVE INDEX AND FILM THICKNESS OF THIN FILM,申请号JP19910088782-传众专利搜索

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发明名称	MEASURING METHOD FOR REFRACTIVE INDEX AND FILM THICKNESS OF THIN FILM
摘要
申请公布号	JPH04320904(A)	申请公布日期	1992.11.11
申请号	JP19910088782	申请日期	1991.04.19
申请人	RICOH CO LTD	发明人	ISOBE TAMI
分类号	G01B11/06;G01N21/41	主分类号	G01B11/06
代理机构		代理人
主权项
地址

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