发明名称 Self-aligned bipolar transistor using selective polysilicon growth
摘要 A polysilicon self-aligned transistor has a polysilicon layer (24) with a cavity (30) formed therein. To form the polysilicon layer (24) with a cavity (30), a thin seed layer (14) is disposed over an epitaxial layer (11a). Dielectric layers (16, 18) are formed over the seed layer (14), and are subsequently etched to define the polysilicon layer (24) and the cavity (30). The cavity (30) is defined by a dielectric plug (22). The exposed seed layer (14) is used to selectively grow the polysilicon layer (24). Thereafter, the dielectric plug (22) is removed to form the cavity (30) through which the base (32) is implanted into the substrate (12) and the emitter (36) is formed.
申请公布号 US5162245(A) 申请公布日期 1992.11.10
申请号 US19910710243 申请日期 1991.06.03
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 FAVREAU, DAVID P.
分类号 H01L21/285;H01L21/331;H01L29/08;H01L29/417;H01L29/423 主分类号 H01L21/285
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