发明名称 PHOTOMASK
摘要 PURPOSE:To form resist patterns having good etching resistance by suppress the film decrease of the resist patterns. CONSTITUTION:Plural light shielding patterns 5 are formed on one main surface side of a transparent substrate 4. Further, antireflection coating 10 of >=15% and >=40% reflectivity are formed on the respective light shielding patterns 5. A part of light L4 is reflected toward the resist film by the antireflection coating 10 and the generation of the film decrease is prevented. The resist patterns having the excellent etching resistance are thus formed.
申请公布号 JPH04317063(A) 申请公布日期 1992.11.09
申请号 JP19910085157 申请日期 1991.04.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 KAMON KAZUYA
分类号 G03F1/46;G03F1/58;H01L21/027 主分类号 G03F1/46
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