| 摘要 |
PURPOSE:To enable measurement with no error resulting from the temperature fluctuation of fresh air by measuring and holding the dark current of a photoelectric transfer element a fixed time earlier than radiation exposure, and finding from the value the temperature of the photoelectric transfer element at the exposure, and correcting the temperature. CONSTITUTION:An incident X-ray is converted into a current via a fluorescent material 102 and a photoelectric transfer element 101. The current is transmitted to a signal processing unit 201 and a dark current data holding circuit 109. The device 201 converts the current signal into a voltage and then the voltage is A/D converted and subjected to various kinds of processing and stored as data about measurement in a storage device. The circuit 109 stores data about dark current serving as offset data during measurement of offset data immediately before X-ray exposure. The device 201 finds the temperature of the element 101 using a predetermined equation according to the offset data and the temperature characteristic data of dark current stored in a temperature characteristic data memory 110, and further corrects data on measured X-rays according to data on the temperature characteristics of the sensitivity of the combined body of the element 101 and the fluorescent material 102, which is stored in the memory 110.
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