| 摘要 |
PURPOSE:To increase the number of decodable test conditions and shorten testing time without increasing the number of test terminals for controlling a test circuit and, at the same time, to simplify the hardware and software required at the time of performing tests and improve the probability of the tests. CONSTITUTION:A rise and fall detection circuit EDGE detects the changing point of a reset pulse by distinguishing whether the point is a rising or falling point. A timer counter circuit COUNT stops its counting operation when a counter stop signal STOP8 given from a timer counter control circuit CONT rises and measures the width of the low-level period of the reset pulse. A test signal TEST1 rises to a high level only when the width of the low-level period of the measured reset pulse coincides with the low-level period of the reset pulse stored in a register circuit MEM1 and the timer counter circuit COUNT is stopped due to the rise of the reset pulse. |
