发明名称 APPARATUS FOR INSPECTING TRANSPARENT MOLD IC
摘要 PURPOSE:To provide the title apparatus capable of automating the inspection of the appearance of a transparent mold IC. CONSTITUTION:An oblique illumination part 6, a vertical illumination part 7 and a transmission illumination part 8 are successively changed over by an illumination change-over part 13 to illuminate a transparent mold IC 1 in every direction and the respective images of said IC are taken by a television camera 5 through a microscope 3. The obtained images are processed by an image processing part 10 through an image memory 9 and the quality of the transparent mold IC is judged based on the processed images by a judging part 11 to obtain a judgment result signal 12. Therefore, the surface or interior flaw of the transparent mold IC can be automatically and accurately inspected.
申请公布号 JPH04315036(A) 申请公布日期 1992.11.06
申请号 JP19910106502 申请日期 1991.04.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 UNO MASAHIKO;HIBARA TATSUNORI
分类号 G01B11/24;G01N21/84;G01N21/88;G01N21/94;G01N21/956;G01R31/26;G06T1/00;H01L21/66;H04N7/18 主分类号 G01B11/24
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