发明名称 |
APPARATUS FOR INSPECTING TRANSPARENT MOLD IC |
摘要 |
PURPOSE:To provide the title apparatus capable of automating the inspection of the appearance of a transparent mold IC. CONSTITUTION:An oblique illumination part 6, a vertical illumination part 7 and a transmission illumination part 8 are successively changed over by an illumination change-over part 13 to illuminate a transparent mold IC 1 in every direction and the respective images of said IC are taken by a television camera 5 through a microscope 3. The obtained images are processed by an image processing part 10 through an image memory 9 and the quality of the transparent mold IC is judged based on the processed images by a judging part 11 to obtain a judgment result signal 12. Therefore, the surface or interior flaw of the transparent mold IC can be automatically and accurately inspected. |
申请公布号 |
JPH04315036(A) |
申请公布日期 |
1992.11.06 |
申请号 |
JP19910106502 |
申请日期 |
1991.04.12 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
UNO MASAHIKO;HIBARA TATSUNORI |
分类号 |
G01B11/24;G01N21/84;G01N21/88;G01N21/94;G01N21/956;G01R31/26;G06T1/00;H01L21/66;H04N7/18 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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