| 摘要 |
PURPOSE:To reduce the number of memory test patterns to a large extent and to conserve a simulation time and the capacity of a pattern memory. CONSTITUTION:A pattern forming indication means 2 indicates data necessary for the formation of a pattern such as the data related to an address wire, a data wire and a control signal wire, the data related to a control signal and clock to a control signal and clock operation or the like to input them to a plurality of memories. A pattern compression means 3 performs the indication input to the memories so that the indicated signal wires can be tested at the same time without contradiction. An indication analyzing means 4 analyzes the contents indicated and inputted by the pattern forming indication means 2 and the compression indication means 3 to output pattern forming data and pattern compression data. A pattern forming means 7 receives the input of the logical circuit data 1 of an LSI wherein a plurality of memories are present to form a test pattern 8 capable of simultaneously testing the respective memories in the same pattern based on the pattern forming data and the pattern compression data. |
