发明名称 PHASE SHIFT MASK
摘要 PURPOSE:To enhance the precision of pattern transfer to a semiconductor wafer by always uniformizing intensity of light passing through the phase shift mask. CONSTITUTION:The recessed part 5 is formed on the bottom side of a glass substrate 1 at the position just opposite to the position on which the shifter film 4 is formed and the depth t2 of the recessed part 5 is set so as to equalize the intensity of the light transmitted through only the glass substrate 1 as thick as t0 almost to that of the light transmitted through the shifter film 4 and the t1 thick glass substrate 1.
申请公布号 JPH04316047(A) 申请公布日期 1992.11.06
申请号 JP19910083701 申请日期 1991.04.16
申请人 MITSUBISHI ELECTRIC CORP 发明人 SHIGETOMI AKIRA;IMAI TADAYOSHI;OZAWA HIDEHIKO;TAKAHATA OSAMU
分类号 G03F1/30;G03F1/68;G03F1/80;H01L21/027 主分类号 G03F1/30
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