发明名称 METHOD OF EXAMINING X-RAY FILMS AND THE LIKE AND AN EXAMINATION CABINET FOR SUCH FILM EXAMINATION
摘要 PCT No. PCT/SE88/00430 Sec. 371 Date Feb. 23, 1990 Sec. 102(e) Date Feb. 23, 1990 PCT Filed Aug. 22, 1988 PCT Pub. No. WO89/02096 PCT Pub. Date Mar. 9, 1989.When examining X-ray film in an examination cabinet, the films are advanced consecutively in a horizontal direction from a magazine attached or capable of being attached to one side of the cabinet. The films are placed against each other in the magazine and are removed therefrom at least partly by a feed roller. Oppositely angled parts located on an endless transporting device engage the lower edges of respective films. After being examined, the films are delivered to a further magazine located on the other side of the cabinet. Located at one end of the cabinet is a ramp, on which is mounted a plurality of diodes which enable the various operations carried out in conjunction with the examination of X-ray film to be automated. The cabinet, magazine and transporting device can be constructed in the form of a module system. One of two modules can be placed above the other, and the modules can be adjusted angularly in relation to each other. The invention also relates to the examination cabinet itself.
申请公布号 US5159771(A) 申请公布日期 1992.11.03
申请号 US19900465113 申请日期 1990.02.23
申请人 OHLSON, CARL-ERIC 发明人 OHLSON, CARL-ERIC
分类号 G02B27/02 主分类号 G02B27/02
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