发明名称 METHOD OF PRODUCING OPTICALLY FLAT SURFACES ON PROCESSED SILICON WAFERS
摘要 A method for producing optically flat thin semiconductor wafers (12) bonded to a substrate (16). The wafer (12) is bonded without touching the top surface of the wafer (12). Also, the bond is created without the use of pressure. Electrostatic bonding, or contact bonding or both may be employed. After the wafer (12) is bonded, it is then polished to a desired thickness and flatness. After contact bonding and polishing the wafer (12) may then be removed for further processing. The wafer may then be contact bonded to a final substrate (b 34) or electrostatically bonded to a final substrate (42). The contact bonding technique may also be employed as a means for holding the wafer (12) during precise photolithography. The optical flatness achieved permits improved yields over conventional means for securing wafers during photolithography. The electrostatic bonding technique permits extremely thin optically flat silicon wafers to be produced.
申请公布号 US5160560(A) 申请公布日期 1992.11.03
申请号 US19880201809 申请日期 1988.06.02
申请人 HUGHES AIRCRAFT COMPANY 发明人 WELKOWSKY, MURRAY S.;VASUDEV, P. K.;REIF, PHILIP G.;GOODWIN, NORMAN W.
分类号 B23Q3/15;H01L21/302;H01L21/304;H01L21/306;H01L21/683 主分类号 B23Q3/15
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