发明名称 |
MASK WITHIN A CONCAVE SEMICONDUCTOR STRUCTURE |
摘要 |
BU9-89-027 A method is described for selectively masking sidewall regions of a concave surface formed in a semiconductor body, the method comprising the steps of: forming a conformal layer of masking material on a sidewall of the concave structure; emplacing in the concave structure, a selectively removable material that partially fills the concave structure, an upper surface of the material determining the edge of a region of the concave structure to be masked; removing a portion of the conformal layer above the upper surface of the selectively removable material; and removing the selectively removable material to leave a region of remaining conformal material as a mask.
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申请公布号 |
CA2061120(A1) |
申请公布日期 |
1992.10.30 |
申请号 |
CA19922061120 |
申请日期 |
1992.02.12 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BEILSTEIN, KENNETH E., JR.;BERTIN, CLAUDE L.;WHITE, FRANCIS R. |
分类号 |
C23C16/06;H01L21/311;H01L21/312;H01L21/3213;H01L21/336;H01L21/47;H01L21/8242;H01L27/10;H01L27/108;H01L29/78;(IPC1-7):H01L21/027 |
主分类号 |
C23C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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