发明名称 MASK WITHIN A CONCAVE SEMICONDUCTOR STRUCTURE
摘要 BU9-89-027 A method is described for selectively masking sidewall regions of a concave surface formed in a semiconductor body, the method comprising the steps of: forming a conformal layer of masking material on a sidewall of the concave structure; emplacing in the concave structure, a selectively removable material that partially fills the concave structure, an upper surface of the material determining the edge of a region of the concave structure to be masked; removing a portion of the conformal layer above the upper surface of the selectively removable material; and removing the selectively removable material to leave a region of remaining conformal material as a mask.
申请公布号 CA2061120(A1) 申请公布日期 1992.10.30
申请号 CA19922061120 申请日期 1992.02.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BEILSTEIN, KENNETH E., JR.;BERTIN, CLAUDE L.;WHITE, FRANCIS R.
分类号 C23C16/06;H01L21/311;H01L21/312;H01L21/3213;H01L21/336;H01L21/47;H01L21/8242;H01L27/10;H01L27/108;H01L29/78;(IPC1-7):H01L21/027 主分类号 C23C16/06
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