发明名称 |
Field effect-controllable semiconductor device - has insulation layer to prevent switch-on of bipolar structure |
摘要 |
A field effect-controllable semiconductor device has a semiconductor body with two main faces (5,6), the first (5) of which adjoins a first conductivity type source region (4) adjacent a second conductivity type gate region (3), the novelty being that an insulation layer (7) is adjacent the source region (4) at a location between the source region (4) and the second main face (6). The insulation layer (7) may be a silicon oxide or a silicon nitride layer having at least the same lateral dimensions as the source region (4) and pref. being less than 1 micron thick. The source region (4) is pref. electrically connected to the gate region (3). USE/ADVANTAGE - The device may be a MOS transistor, a field effect-controlled thyristor or an IGBT, esp. a vertical MOSFET, a lateral MOSFET or a lateral MOSFET and a CMOSFET. The insulation layer prevents or at least hinders switch-on of the bipolar structure, thus preventing latch-up or sec. breakdown.
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申请公布号 |
DE4113756(A1) |
申请公布日期 |
1992.10.29 |
申请号 |
DE19914113756 |
申请日期 |
1991.04.26 |
申请人 |
SIEMENS AG, 8000 MUENCHEN, DE |
发明人 |
STENGL, JENS-PEER, 8082 GRAFRATH, DE;TIHANYI, JENOE, DR., 8000 MUENCHEN, DE |
分类号 |
H01L21/336;H01L27/092;H01L29/06;H01L29/08;H01L29/10;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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