| 摘要 |
PURPOSE:To shorten time required for a test by simultaneously driving plural peripheral circuits to test a function. CONSTITUTION:Partial bits of plurally divided internal data buses 8, 9 are distributed to plural peripheral circuits 2 to 7, and in a test mode, a CPU 1 select plural peripheral circuits to be tested by using a test address TEST ADDR, a test signal TEST, etc., applies test data to respective circuits to be tested through the internal data buses 8, 9 corresponding to the distributed bits to simultaneously drive and test the plural peripheral circuits. |
