发明名称 |
Ordering shift register latches in a scan ring to facilitate diagnosis, testing and isolation. |
摘要 |
<p>In a shift register latch scan string such as that employed in level sensitive scan design (LSSD) methodologies, primary input and/or primary output signal line connections are distributed in a substantially uniform fashion along the length of the shift register scan string configuration so as to provide a mechanism for testing for fault conditions existing along the scan string. <IMAGE></p> |
申请公布号 |
EP0510389(A1) |
申请公布日期 |
1992.10.28 |
申请号 |
EP19920105518 |
申请日期 |
1992.03.31 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
KOO, CATHERINE CHI;MESSINA, BENEDICTO UMBERTO;SAIA, JERRY |
分类号 |
H03K19/00;G01R31/28;G01R31/3185;G06F11/267 |
主分类号 |
H03K19/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|