发明名称 Method for producing a field-effect type semiconductor device
摘要 A method for producing field-effect type semiconductor devices is disclosed which includes the steps of: forming a gate insulator film on a semiconductor substrate; forming a conductor film on the gate insulator film; and implanting impurity ions in the semiconductor substrate through the gate insulator film and the conductor film for the purpose of controlling a threshold voltage of the device, wherein the conductor film is employed as a gate electrode of the device. The method of this invention has the excellent advantages of readily controlling a threshold voltage of field-effect type semiconductor devices and of preventing the scatter of the threshold voltage values. An alternative embodiment employs formation of a second conductor film and implantation from an inclined direction.
申请公布号 US5158903(A) 申请公布日期 1992.10.27
申请号 US19900606493 申请日期 1990.10.31
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 HORI, ATSUSHI;KAMEYAMA, SHUICHI;SHIMOMURA, HIROSHI;SEGAWA, MIZUKI
分类号 H01L29/78;H01L21/265;H01L21/266;H01L21/336 主分类号 H01L29/78
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