High speed bare chip test socket

摘要

An electrical socket (10) for interconnecting circuits on an integrated circuit chip to circuits on a substrate is disclosed. The socket (10) includes a base section (12), an upper section (16) and a metallized plastic membrane (14) having circuit traces (72) thereon. Contact pins (52) in the upper section (16) electrically connect circuits on the chip to inner ends (82) of the traces (72) and outer ends (84) of the traces (72) engage circuits on a substrate.