APPARATUS AND METHOD FOR SELF-TEST MODULARIZED FOR EMBEDDED TYPE SRAM

摘要

PURPOSE: To improve the detection capacity of a self test and to reduce test time and cost on the self test which is can be changed against various SRAM architectures and sizes and which is made into a module for buried SRAM. CONSTITUTION: The self test which can be changed for the test of SRAM buried on a semiconductor die is provided. The self test can be conducted by a self test circuit 10 which is variable so that an address and a data pattern can be generated for the various SRAM architectures and sizes and which is made into the module. An address block 11 generates the address for regulating a test word in SRAM 11. The address block 11 generates time delay used in a data holding test. A data block 12 generates a test pattern written in a SRAM test position. The data block 12 analyzes data which is read from the SRAM test word.