发明名称 PATTERN FORMING METHOD
摘要 PURPOSE:To enhance etching resistance and also to prevent drop of pattern precision at the time of exposure by using a graft polymerization reaction. CONSTITUTION:The desired resist pattern is obtained on the substrate to be processed by forming an aluminum film 12 on the substrate 11, forming a first layer 13 made of a polymer capable of graft polymerization on the film 12, forming a second layer 14 made of a photosensitive resin on the layer 13, exposing the layer 14 to g line of a mercury lamp having the desired pattern, removing the exposed region of layer 14 to disclose the layer 13, graft-polymerizing the disclosed layer 13 with a monomer to form a graft polymer film 18 on the surface of the layer 13, removing the layer 14 left unexposed, and then, selectively removing the layer 13 by using the polymer film 18 as a mask.
申请公布号 JPH04301852(A) 申请公布日期 1992.10.26
申请号 JP19910089107 申请日期 1991.03.29
申请人 TOSHIBA CORP 发明人 ITO SHINICHI;KUMAGAI AKITOSHI;NAKASE MAKOTO
分类号 G03F7/095;G03F7/26;H01L21/027 主分类号 G03F7/095
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