发明名称 PATTERN AREA RATIO MEASURING SYSTEM
摘要 PURPOSE:To obtain a pattern area ratio measuring system to be built in a print processing system. CONSTITUTION:An automatic developing system 2 is coupled through a carrying system 3 with a pattern area ratio measuring system 4. When a form plate is set in the auto-feeder 1 of the developing system 2, developing and area ratio measuring are carried out automatically. When a priority button is depressed during measurement of a preset form plate, the auto-feeder 1 can be stopped. When a priority item is set in the feeder and measurement condition data thereof are inputted, the item can be measured in preference to conventional measurements.
申请公布号 JPH04297811(A) 申请公布日期 1992.10.21
申请号 JP19910085799 申请日期 1991.03.27
申请人 TOPPAN PRINTING CO LTD 发明人 SUGIMURA SHINJI;YOSHIDA MASAKICHI;TOZAWA SHINICHI
分类号 B41M1/06;B41F31/02;G01B11/28 主分类号 B41M1/06
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