发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To easily make a pellet to be thin in thickness and suppress the generation of cracking and chipping of wafer so as to reduce the wear of dicing blade by performing dicing for a semiconductor wafer surface by shorter cutting depth than its overall thickness and then grinding the rear face of the semiconductor wafer. CONSTITUTION:A semiconductor wafer 1 is half-cut along with scribe lines by using a dicing blade 3. The depth of the half-cut grooves 4, 4... is made to be almost same as the thickness of a pellet of semiconductor device which is subjected to manufacture. A surface protecting tape 5 is stuck on the surface 1a of the semiconductor wafer 1 in order that the surface of the semiconductor 1 is protected when grinding the rear face. Then, the rear face 1b of the semiconductor 1 is etched to obtain the specified pellet thickness for the wafer 1, and the wafer 1 is pelletized. After such processing, the semiconductor wafer 1 is wet-etched to remove the deformation due to rear face grinding. Thus, the wear of dicing blade can be reduced.</p>
申请公布号 JPH04297056(A) 申请公布日期 1992.10.21
申请号 JP19910068811 申请日期 1991.03.08
申请人 SONY CORP 发明人 YAMANAKA HIDEO
分类号 H01L21/301;H01L21/78 主分类号 H01L21/301
代理机构 代理人
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