Dynamic random access memory device with multiple word line selector used in burn-in test.

摘要

A dynamic random access memory device is subjected to a burn-in test operation prior to delivery from a factory, and is equipped with an auxiliary word line driving unit (5) so that all of the word lines (W1 to Wm) are simultaneously driven by the auxiliary word line driving unit in the burn-in test operation, thereby shrinking time period for the burn-in test operation. <IMAGE>