发明名称 Method for making a charge transfer semiconductor device having an oblong trench
摘要 In making trench type semiconductor CCD by using oblique ion-injections into an oblong trench groove in a semiconductor substrate region for injecting impurity atoms, an injection angle alpha for injecting a first conductivity type impurity to form isolation region into the side walls and also for injecting a second conductivity type impurity to form a charge transfer region thereon is selected less than pi /4, and another injection angle beta for injecting the same impurity into the end wall to form the end part of the isolation region and a third injection angle gamma for injecting the second conductivity type impurity thereon into the end wall to form the end part of the charge transfer region are selected: <IMAGE>
申请公布号 US5156985(A) 申请公布日期 1992.10.20
申请号 US19910696954 申请日期 1991.05.08
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YAMADA, TAKAHIRO;SUGAYA, TADASHI
分类号 H01L21/76;H01L21/265;H01L21/339;H01L27/148;H01L29/762 主分类号 H01L21/76
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