发明名称 |
Method for making a charge transfer semiconductor device having an oblong trench |
摘要 |
In making trench type semiconductor CCD by using oblique ion-injections into an oblong trench groove in a semiconductor substrate region for injecting impurity atoms, an injection angle alpha for injecting a first conductivity type impurity to form isolation region into the side walls and also for injecting a second conductivity type impurity to form a charge transfer region thereon is selected less than pi /4, and another injection angle beta for injecting the same impurity into the end wall to form the end part of the isolation region and a third injection angle gamma for injecting the second conductivity type impurity thereon into the end wall to form the end part of the charge transfer region are selected: <IMAGE>
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申请公布号 |
US5156985(A) |
申请公布日期 |
1992.10.20 |
申请号 |
US19910696954 |
申请日期 |
1991.05.08 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
YAMADA, TAKAHIRO;SUGAYA, TADASHI |
分类号 |
H01L21/76;H01L21/265;H01L21/339;H01L27/148;H01L29/762 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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