发明名称 |
Blooming measuring method for solid state image pick-up device, and apparatus suitable for the measuring |
摘要 |
A blooming measuring method for solid state image pick-up device and an apparatus thereof are disclosed, the method being constituted such that a spot beam having a certain area is irradiated to the light receiving zone of the solid state image pick-up device; the number of high level signal charges are counted from among the signal charges which are outputted from the solid state image pick-up device, and which are corresponding to one picture; and the counted value is compared with the area of the above mentioned spot beam. The apparatus of the present invention comprises: a light ray supplying means for supplying a spot beam; a driving signal generating means for driving the solid state image pick-up device; a signal detecting means for detecting only the signal charges; and a counting means for counting only the high level signals. According to the present invention, the variations of the characteristics can be excluded, and the measured results are outputted in a quantitative form, thereby making it possible to understand the characteristics exactly and precisely.
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申请公布号 |
US5157501(A) |
申请公布日期 |
1992.10.20 |
申请号 |
US19890437389 |
申请日期 |
1989.11.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NO, YOUNG B.;KIM, DAE K. |
分类号 |
G01D21/00;H01J9/42;H04N5/335;H04N5/341;H04N5/359;H04N5/3728;H04N17/00 |
主分类号 |
G01D21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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