发明名称 Electrical signal path length measurement for IC testing
摘要 The path length measurement is used to verify that all signal path sections (SS) have the same electrical length using a transmitter and receiver at one end of the latter. The opposite ends of the signal path sections (SS) are short-circuited, with simultaneous emission of a pulse along the signal path sections (SS) and transmission of a central pulse from the short-circuited end to the receiver (E). The point of reception of the control pulse is recorded and entered in a table, with the process repeated for all signal path sections (SS), to provide measurements defining the relative electrical lengths of the signal path sections. Pref. a short-circuit bridge (KB) is used for interconnecting the short-circuit ends of the signal path sections (SS).
申请公布号 DE3874529(D1) 申请公布日期 1992.10.15
申请号 DE19883874529 申请日期 1988.05.05
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 WELZHOFER, KLAUS, W-8032 GRAEFELFING, DE;VUKSIC, ANTUN, W-8000 MUENCHEN 83, DE
分类号 G01R27/28 主分类号 G01R27/28
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