发明名称 DIAGNOSTIC SYSTEM
摘要 PURPOSE:To analyze a failure part by staring failure information obtained from a test program at the time of failure by a table format in each part and pointing out a part corresponding to the failure information at the time of executing the test program. CONSTITUTION:This diagnostic system is provided with a processor 1, main storage device 2, test control program part 3, devices 4 to be tested, a test program part 5, analytic program part 6, analytic program 7, dictionaries 8, 9, error information storing table 10, diagnostic result outputting buffer 11, test table 12, and a lacking test registering table 13. A corresponding table between parts to be completedly replaced and failure information obtained from the test program when the parts are failed is prepared as a table format, and when a certain failure information is obtained from the test program, its corresponding failure part is retrieved from the failure information to find out the failure part.
申请公布号 JPH04291631(A) 申请公布日期 1992.10.15
申请号 JP19910056482 申请日期 1991.03.20
申请人 HITACHI LTD;HITACHI ASAHI ELECTRON:KK;HITACHI NISHI SHOHIN ENG KK 发明人 UCHIKAWA YOSHIHIKO;KATO TOMOYASU;EMOTO AKIO
分类号 G06F11/22 主分类号 G06F11/22
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