TROUBLE SIMULATION METHOD FOR SEMICONDUCTOR DEVICE AND DATA PREPARATION DEVICE FOR TROUBLE SIMULATION

摘要

PURPOSE:To shorten the simulation processing time for the trouble simulation method for a semiconductor device and a data producing device for the trouble simulation. CONSTITUTION:A function block terminal detecting part 6 detects each of input and output terminals of each function block consisting of plural basic gates. A net data detecting part 7 detects the net data on each detected input or output terminal of each function block. A basic gate terminal detecting part 8 detects the input or output terminal of the gate corresponding to each detected net data. An assumptive trouble eliminating part 9 eliminates the troubles except those assumptive once of the gate input or output terminal detected by the part 8 among all assumptive troubles defined at the input or output terminal of each basic gate of a corresponding function block. Then the part 9 prepares the data on a trouble eliminating circuit.