发明名称 MARKING DEVICE FOR FLAW PORTION ON STRIP
摘要 <p>PURPOSE:To enable a portion with flaw to be identified easily when inspecting it again. CONSTITUTION:A title item consists of a flaw detection device 6 for detecting a flaw on a strip surface based on an amount of voltage which is obtained by scanning the strip surface with laser beam and then receiving a reflection light with a photoelectric conversion element a tracking device 11 for tracking a travel of any position in length direction of the strip based on a peripheral speed of a strip transport roller, and a marking device 12 for performing marking on the portion with flaw on the strip which is obtained from the flaw data from the flaw detection device and the flaw position traveling data from the tracking device. Since a mark is given to the portion with flaw on the strip, a purchaser of a material can find the portion with flaw easily when uncoiling it.</p>
申请公布号 JPH04291138(A) 申请公布日期 1992.10.15
申请号 JP19910081919 申请日期 1991.03.20
申请人 NIPPON STEEL CORP 发明人 NAKANO MASAAKI;TANAKA HIROYUKI;YOSHIOKA NORIYUKI
分类号 B21C51/00;G01B11/00;G01B11/30;G01N21/89;G01N21/892 主分类号 B21C51/00
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