| 摘要 |
PURPOSE:To conduct the test with an optional frame spread arrangement pattern to a multi-frame with respect to the PN pattern check circuit used for a time division multiplex bus tester testing the data communication of a time division multiplex bus in the time division multiplex multi-frame communication system by means of loopback information of a PN pattern data. CONSTITUTION:The circuit is provided with frame setting means 11-1n provided corresponding to each multi-frame and allocating a PN pattern data sent/ received in each frame and a parallel/serial conversion means 2 converting a frame setting parallel signal outputted from the frame setting means 11-1n into a serial signal. |
