发明名称 |
LAVER DEFECT INSPECTING APPARATUS |
摘要 |
PURPOSE:To compensate fluctuation in transmitted light amount of laver itself and correctly detect whether or not an opaque foreign material mixed in the laver exists. CONSTITUTION:An analog image signal (a) of a piece of laver 10 passing through a carrier part 8 at a constant speed is output from a one-dimensional camera 1 and converted into a digital image signal (b) in an image acquisition part 2. A tip detecting part 3 senses the tip of the passing laver 10, and a total sum of image signals of scanning lines of a predetermined number of times is divided by a number of pixels in an entire effective field of view in an average level calculation part 4 to have an image average level (e) calculated. An image slice level (f) is set in a slice level setting part 5, binary image signals (c) are output in an image binary-coding decision part 6 and whether or not an opaque foreign material has mixed into the laver 10 is determined in a defect inspection and decision part 7. |
申请公布号 |
JPH04286906(A) |
申请公布日期 |
1992.10.12 |
申请号 |
JP19910051875 |
申请日期 |
1991.03.18 |
申请人 |
NEC CORP;YAMAMOTO NORITEN:KK |
发明人 |
ARITA SADAO;YAMAMOTO KEIZO |
分类号 |
G01B11/30;A23L17/60;G01B11/24;G01N21/89;G01N21/892 |
主分类号 |
G01B11/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|