发明名称 |
MANUFACTURE OF FILM CARRIER |
摘要 |
<p>PURPOSE:To ensure superior connection at the time of semiconductor element mounting, by erasing cutter marks (note: uneven flaws caused by working) formed on the surface of a metal conductor layer of an aperture part formed on a two-layered structure film carrier by cutting and eliminating an organic insulating film left in recessed parts on a bonded surface of the metal conductor layer and the organic insulating layer. CONSTITUTION:The manufacturing method of a film carrier wherein an aperture part 3 such as a lead hole and a positioning hole formed, by cutting on a two- layered structure film carrier composed of a metal conductor layer 1 and an organic insulating layer 2 is subjected to chemical polishing.</p> |
申请公布号 |
JPH04287337(A) |
申请公布日期 |
1992.10.12 |
申请号 |
JP19910075798 |
申请日期 |
1991.03.15 |
申请人 |
CHISSO CORP |
发明人 |
FURUKAWA HIDENORI;IIJIMA TAKASHI;TOKUNAGA SHIGENORI;TAKAHASHI AKIO |
分类号 |
B32B15/08;B32B37/00;H01L21/60 |
主分类号 |
B32B15/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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