| 摘要 |
The present invention relates to a measurement device of the type comprising a probe formed by an elongate support (100) which carries a resistive metal element (300), with a high temperature coefficient, two connection pieces (400) joined to the ends of the resistive metal element (300), a correction resistor (500) connected in parallel with the latter, characterised in that the correction resistor (500) is formed by a component of the CMS type fixed on the said connection pieces (400). <IMAGE>
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