发明名称 STRUCTURE OF SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF.
摘要 <p>A semiconductor storing device using ferroelectric substances in which, by forming an oxygen-nonpermeable conductive film (107) between a semiconductor substrate (101) and a ferroelectric capacitor, and by making the film (107) nonconductive through an oxidation treatment, oxygen is prevented from diffusing in subsequent heat treatment processes in oxidation atmosphere, and the characteristics of the elements under the oxygen-nonpermeable film can be prevented from deteriorating by oxygen. <IMAGE></p>
申请公布号 EP0506980(A1) 申请公布日期 1992.10.07
申请号 EP19910919276 申请日期 1991.10.15
申请人 SEIKO EPSON CORPORATION 发明人 KATO, KOJI
分类号 H01L21/8247;H01L21/8246;H01L27/105;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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