发明名称 APPARATUS AND METHOD FOR MEASURING WEAK, LOCATION-DEPENDENT AND TIME-DEPENDENT MAGNETIC FIELDS
摘要 An apparatus for measuring weak, location-dependent and time-dependent magnetic fields emitted from a source situated in an examination subject includes a sensor arrangement having at least ten gradiometers of the first order, each gradiometer being inductively coupled to a DC-SQUID. The sensor arrangement and the examination subject are disposed in a room which shields the examination subject and the sensor arrangement from magnetic fields. The room has a shielding factor of at least 10 for magnetic alternating fields having a frequency of 0.5 Hz, the shielding factor increasing with increasing frequency. A method for operating the apparatus is also disclosed.
申请公布号 US5152288(A) 申请公布日期 1992.10.06
申请号 US19910774635 申请日期 1991.10.09
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 HOENIG, ECKHARDT;REICHENBERGER, HELMUT;SCHNEIDER, SIEGFRIED
分类号 A61B5/04;A61B5/05;G01R33/00;G01R33/035 主分类号 A61B5/04
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