发明名称 |
APPARATUS AND METHOD FOR MEASURING WEAK, LOCATION-DEPENDENT AND TIME-DEPENDENT MAGNETIC FIELDS |
摘要 |
An apparatus for measuring weak, location-dependent and time-dependent magnetic fields emitted from a source situated in an examination subject includes a sensor arrangement having at least ten gradiometers of the first order, each gradiometer being inductively coupled to a DC-SQUID. The sensor arrangement and the examination subject are disposed in a room which shields the examination subject and the sensor arrangement from magnetic fields. The room has a shielding factor of at least 10 for magnetic alternating fields having a frequency of 0.5 Hz, the shielding factor increasing with increasing frequency. A method for operating the apparatus is also disclosed.
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申请公布号 |
US5152288(A) |
申请公布日期 |
1992.10.06 |
申请号 |
US19910774635 |
申请日期 |
1991.10.09 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
HOENIG, ECKHARDT;REICHENBERGER, HELMUT;SCHNEIDER, SIEGFRIED |
分类号 |
A61B5/04;A61B5/05;G01R33/00;G01R33/035 |
主分类号 |
A61B5/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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