| 摘要 |
A distributed timing signal generator as a component of a per-pin architecture tester is disclosed. Start control circuits are provided per pin, and the same start signal is provided from the outside for each of the start control circuits. Each of the start control circuits then determines the start timing for at least one timing generator accommodated therein by the variable set values, and starts to control each timing generator at the thus-determined start timing. Thus, timing signals which correspond to the respective variable set values are produced from the respective timing generators with high timing accuracy and in interlock with each other. It is possible to provide timing generators for a driver, for input/output (I/O) control, and for a comparator, and in this case it is easy to obtain the respective timing signals.
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